The course is intended especially for students who deal with modeling of interactions of particles with solids. The course introduces basic approaches in the modeling of charged particle passage, presents simulation programs in this field - SRIM (The Stopping and Range of Ions in Matter), FLUX (software for ion channeling in crystalline materials), and programs for the generation of back-scattered ion spectra in Rutherford Backscatter (RBS), Elastic Forward Scattering (ERDA) and Nuclear Reaction Analysis (NRA), namely SIMNRA and WiNDF (a comprehensive multi-ion analysis evaluation program): - Charged particle penetration in solids - energy losses in material - MC simulation of ion passage through matter in SRIM - Elastic and inelastic processes following the impact of charged particles on the solid - Fundamentals of nuclear analytical ion methods - RBS, ERDA, quantitative and qualitative analysis - Simulation of RBS, ERDA and NRA spectra using SIMNRA program ? Fundamentals of Nuclear Analytical Ion Methods - PIXE, PIGE, NRA, Quantitative and Qualitative Analysis - Simulations of PIXE, PIGE, RBS, ERDA using WiNDF - Method of ion channeling in crystalline materials - Simulating of the ion channelling effect using FLUX, generating 2 D ion flux maps for different crystal structures and orientations - Simulation of ion channellin spectra by the FLUX program for GaN, Si and generation of angle scans together with the positioning of dopants in the crystal lattice - Simulation - Practical Exercises in Tandetron Laboratory, ÚJF AV ČR, v. v.i.
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