The course provides a comprehensive overview of modern X-ray structural analyses and imaging, using synchrotron-based X-ray radiation. It covers the fundamental X-ray processes and selected techniques (scattering, spectroscopy and imaging) important to the study of the physical, chemical and biological sciences. Students can benefit from information about the structure of materials beyond the scope of laboratory equipment and expand their possibilities of using highly modern X-ray methods to successfully complete their doctoral studies. The suggested structure of the course and the topics included are given below. The course will take place in the form of oral lectures, but it can also be adjusted to suit the student's individual needs. The topics covered by the course are, though not limited to: 1. Introduction and overview of the topic - Synchrotrons, generation of Synchrotron-based X-ray radiation and X-ray optics, interaction of X-rays with matter. 2. X-ray scattering techniques - Small-angle X-ray Scattering (SAXS) - to determine the microscale or nanoscale structure of particle systems and colloids, X-ray diffraction (WAXS) - to study parameters of crystalline materials, X-ray reflectivity (XRR) - to obtain a thickness and density of thin films, Structural factor and Pair-distribution functions - to investigate a structure of materials (coordination numbers, atomic specimen, bond lengths), Anomalous X-ray scattering (AXS) to investigate a structure at the X-ray energy just below the absorption edge of studied elements, pressure and temperature effects on lattice parameters, etc. 3. X-ray spectroscopy techniques - X-ray Photo-electron spectroscopy (XPS) and Auger spectroscopy to determine the composition and oxidation states of elements represented, X-ray absorption spectroscopy (XAS: XANES - probing of unoccupied states and continuum states using a promoted electron from core-levels, a fingerprint for each individual structure and EXAFS - to obtain coordination numbers, bond lengths, bond strengths, atomic specimens around an absorbing atom), X-ray polarised XAS to study anisotropic structures, X-ray magnetic circular dichroism (XMCD)- information on magnetic properties of an atom (spin and orbital magnetic moment), Electron energy loss spectroscopy (EELS) - to study composition and the EELS spectrum represents a fingerprint for each individual structure similar to XANES, X-ray emission spectroscopy (XES) - to study the electronic structure of chemical compounds and Time-resolved experiments to probe kinetics. 4. X-ray imaging techniques - X-ray tomography - 3D visualisation of materials, X-ray holography - 3D electron density distribution in solids and real-space investigations of static and dynamic properties of nanoscale systems, Deep X-ray lithography - device fabrication using short wavelength X-ray radiation, and other possible techniques. As part of the course, the student will be offered a practical course on data analyses of typical (simple) X-ray diffractograms and X-ray spectra to better understand the theoretical background of synchrotron-based X-ray methods. Literature: 1. S. P. Cramer, X-Ray Spectroscopy with Synchrotron Radiation: Fundamentals and Applications, Springer Nature, (2020). 2. J. Stöhr, The Nature of X-rays and Their Interactions with Matter, Springer, (2023). 3. P. Willmott, An Introduction to Synchrotron Radiation: Techniques and Applications, John Wiley & Sons Ltd., (2019). 4. P. S. Rahimabadi, M. Khodaei, K. R. Koswattage, Review on applications of synchrotron-based X-ray techniques in materials characterization. X-ray Spectrometry 49 (2020) 348.
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