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Orava Jiří, doc. Ing. Ph.D.
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Kormunda Martin, doc. Ing. Ph.D.
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Daniš Stanislav, doc. RNDr. Ph.D.
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Ederer Jakub, Mgr. Ph.D.
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Henych Jiří, doc. Ing. Ph.D.
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Jost Birgit, Dr. Ing.
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Lang Kamil, Ing. CSc.
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Yannopoulos Spyros N., prof.
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The course will provide students with detailed knowledge of modern and advanced materials' characterization methods and their applications in environmental, biomaterial and other relevant sciences and technologies. The focus of the course will be to understand the modern trends such as i) complementary types of characterization techniques of materials, represented by Raman and infrared spectroscopy; ii) correlative types of characterization methods, such as transmission electron microscopy (TEM), local-electrode atom-probe tomography combined (LEAPT) with atomic-force microscopy, AFM, (the latter two are shown as an example in Figure 1); and iii) multi-technique characterization for a comprehensive understanding of functional materials (such as monitoring thin-film properties in-situ during deposition). In collaboration with the partner institute Fraunhofer Institute for Ceramic Technologies and Systems (IKTS), Dresden, the lectures will also highlight the importance of non-destructive (tomography) and application-oriented characterization methods that can be used to understand the relationship between the atomic structure and macroscopic properties for fast materials screening in biomaterial, environmental, and related, sciences. Such materials analysis is crucial, especially in the fast exploitation of materials and their in-operando optimization in biomedical, nanomaterials, and environmental applications, and it is a prerequisite for ensuring fast and reliable commercialization. The course will be flexible and specifically designed to meet the individual needs of each student. The aim will be to provide a theoretical background to a portfolio of techniques which are the most suitable for the topic of the dissertation thesis. The course content will also be moulded to be very complementary to the topics covered by the course "Advances in the application of analytical techniques" as both types of analyses can often be done parallel to each other to obtain the most comprehensive information about materials. The knowledge gained in this theoretical course can be practically applied in the module C - Specialized laboratories and practicals, especially in the practical "Laboratory I - Cleanroom", "Laboratory IV - Advanced microscopy of materials", and "Laboratory VIII - Application-oriented characterization of materials" (the latter will be carried out in the laboratories in IKTS). A detailed example of some topics which can be covered by the course is shown below (of which some will be selected by the student based on the topic of the dissertation thesis). The list is not full and more specialized techniques may also be covered to suit students' scientific needs. The lectures will highlight issues connected with materials characterization relevant to the doctoral programme. 1. Modern Raman spectroscopy 2. Modern applications of infrared spectroscopy 3. Atomic-force microscopy (AFM) 4. Transmission- (TEM) and scanning-(SEM)-electron microscopy, focused-ion beam milling (FIB) 5. Modern trends in the materials surface-characterization by X-ray photoelectron spectroscopy (XPS) 6. X-ray diffraction analysis and tomography Other relevant characterization techniques, modern trends, problems and approaches may include: 7. Ex-situ and in-situ different length 8. Optical properties 9. Local-electrode atom-probe tomography 10. Ultra-fast (flash) calorimetry and heating methods 11. Light scattering in soft matter.
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