Course: High resolution scanning electron microscopy

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Course title High resolution scanning electron microscopy
Course code KBI/REM
Organizational form of instruction Lecture + Lesson
Level of course Bachelor
Year of study not specified
Semester Summer
Number of ECTS credits 2
Language of instruction Czech
Status of course Compulsory
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
Lecturer(s)
  • Benada Oldřich, RNDr. CSc.
Course content
unspecified

Learning activities and teaching methods
unspecified
Learning outcomes
Prerequisites
unspecified

Assessment methods and criteria
unspecified
Recommended literature
  • Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael (Eds.). Scanning Electron Microscopy and X-Ray Microanalysis. Kluwer Academic/Plenum Publishers, New York/Boston/Dordrecht/London/Moscow, 2003, pp. 689.
  • Krumeich, F. (2016). Properties of Electrons, their Interactions with Matter and Applications in Electron Microscopy (http://www.microscopy.ethz.ch/downloads/Interactions.pdf).
  • Krumeich, F. (2018). Introduction into Transmission and Scanning Transmission Electron Microscopy (http://www.microscopy.ethz.ch/downloads/TEM.pdf).


Study plans that include the course
Faculty Study plan (Version) Category of Branch/Specialization Recommended year of study Recommended semester