-
Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael (Eds.). Scanning Electron Microscopy and X-Ray Microanalysis. Kluwer Academic/Plenum Publishers, New York/Boston/Dordrecht/London/Moscow, 2003, pp. 689.
-
Krumeich, F. (2016). Properties of Electrons, their Interactions with Matter and Applications in Electron Microscopy (http://www.microscopy.ethz.ch/downloads/Interactions.pdf).
-
Krumeich, F. (2018). Introduction into Transmission and Scanning Transmission Electron Microscopy (http://www.microscopy.ethz.ch/downloads/TEM.pdf).
|