| Course title | Characterization of materials |
|---|---|
| Course code | UTM/PX323 |
| Organizational form of instruction | Lecture |
| Level of course | Bachelor |
| Year of study | not specified |
| Semester | Winter and summer |
| Number of ECTS credits | 4 |
| Language of instruction | Czech |
| Status of course | Compulsory |
| Form of instruction | unspecified |
| Work placements | unspecified |
| Recommended optional programme components | None |
| Lecturer(s) |
|---|
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| Course content |
|
unspecified
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| Learning activities and teaching methods |
| unspecified |
| Learning outcomes |
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1-3: Principles and physical basis microscopic and diffraction methods for structural analysis. 4th to 9th week: Microscopy techniques: - Optical Microscope - SEM (Scanning Electron Microscopy) - TEM (transmition electron microscopy) - SPM (Scanning Probe Microscopies) - STM (Scanning Tunneling Microscope) - AFM (Atomic Force Microscopy) 10th to 14th week: Diffraction and scattering methods: - LEED (Low Energy Electron Diffraction) - RHEED (Reflection High Energy Electron Diffraction) - XRD (X-ray diffraction) - GISAX (Grazing-Incidence Small-Angle X-Ray Scattering) - Neutron diffraction
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| Prerequisites |
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Students during a lecture acquainted with the principles and possibilities of the basic methods of microscopy and diffraction methods for structural analysis of materials. Course graduate gains further overview of the most important techniques used to describe the morphology and surface topography and analyze crystal structures.
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| Assessment methods and criteria |
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unspecified
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| Recommended literature |
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| Study plans that include the course |
| Faculty | Study plan (Version) | Category of Branch/Specialization | Recommended semester | |
|---|---|---|---|---|
| Faculty: Faculty of Mechanical Engineering | Study plan (Version): Materials (17) | Category: Special and interdisciplinary fields | 2 | Recommended year of study:2, Recommended semester: Winter |