1. Electron microscopy (EM) 1.1 Physical nature of electron microscopy with reference to light microscopy 1.2 Type of electron microscopes - HRTEM and SEM, electron sources (W fiber, cathode LaB6, autoemission electron source FEG), electron lenses, stigmators and detectors, vacuum system. 1.3 Imaging principle (CCD camera), comparison of HRTEM and SEM machining capabilities, atomic resolution, electron diffraction. 1.4 Special detectors - EDS / WDS characteristic X-ray detectors for chemical composition analysis and EELS detectors (enabling in situ high-energy complex spectra with fine structure, bond energy and nanomaterial thickness). 1.5 Sample preparation for HRTEM and SEM - potting, cutting, ultrathin sections (Ultramicrotome), thinning (PIPS, PECS) 2. Atomic force microscopy (AFM) - basic modes (contact, contactless and semi-contact mode), surface detection mechanism (topography). 2.1 Type of AFM tips - use of functional tips for measuring other parameters - scanning probe microscopy (SPM), magnetic force microscopy (MFM) analysis, electrostatic field distribution (EFM) analysis and measurement local conductivity. 2.2 Sample preparation for AFM - selection of particle sizes (solid, non-stick materials), choice of solution for chemical fixation and surface, selection of substrates (mica plates, glass, Si). 3. Comparison of EM and AFM
|
The aim of the course "Electron Microscopy" (EM) is to understand modern microscopic methods, especially high-resolution transmission electron microscopy (HRTEM), scanning electron microscopy (SEM) and atomic force microscopy (AFM). The course builds on modern fields related to EM, such as electron crystallography and software for simulation of HRTEM images and electron diffraction records (JEMs and CrystalMaker & SingleCrystal), which were developed in the last 10 years. The subject of EM gives space to new directions in the field of nanoengineering resp. structured nanomaterials, nanocomposites and nanolaminates / thin films). The aim of the course EM is to obtain the necessary basic information about the construction of electron microscopes, sample preparation and also how to obtain scientific records with different types of microscopes. The course pays attention to indexing electron nanodiffractions using appropriate software and applies it to the study of nanostructures of selected nanomaterials.
|
-
KLAPETEK, P.; OHLÍDAL, I. Theoretical analysis of the atomic force microscopy characterization of columnar thin films. Ultramicroscopy, 94, (19-29), Amsterdam, 2003.
-
KLAPETEK, P.; OHLÍDAL, P.; BÍLEK, J. Atomic force microscope tip influence on the fractal and multi-fractal analyses of the properties of randomly rough surfaces Nanoscale Calibration Standards and Methods. ed. by G. Wilkening and L Koenders, Wiley VCH, 2005.
-
NEČAS, D.; KLAPETEK, P.; GWYDDION. An open-source software for SPM data analysis. Central European Journal of Physics, 2012.
-
V. Hulínský, K. Jurek. Zkoumání látek elektronovým paprskem. SNTL - Praha 1982.
-
WILLIAMS, D., CARTER, B. Transmission Electron Microscopy, I Basics. NY, Springer Inc.,, 1996.
-
WILLIAMS, D., CARTER, B. Transmission Electron Microscopy, II Diffraction. Springer Inc., 1996.
-
WILLIAMS, D., CARTER, B. Transmission Electron Microscopy, III Imaging. NY, Springer Inc., 1996.
-
WILLIAMS, D., CARTER, B. Transmission Electron Microscopy, IV Spectrometry,. NY, Springer Inc., 1996.
|